XRD analysisFigures 1 and 2 shows the XRD patterns of Sr2–xCaxNiWO6 (x = 0.00, 0.02, 0.04, 0.06) compounds and the refined data using the Rietveld refinement approach respectively. A sharp and well defined of XRD patterns were observed in Fig. 1 indicates a good crystalline perovskite phase of the samples. The diffraction peaks that were indexed to hkl plane (011), (002), (112), (013), (004), (123), (114), (024), (231), (224) and (116) matched as reported in previous studies19,20. All compounds formed in double phase with a small amount of Sr2WO5 impurity that present approximately at 28° and marked with asterisk (*) sign. A good agreement between the observed data and calculated line as seen in Fig. 2 indicated an acceptable refinement quality with reliabilities (χ2) between 1.931 and 3.396. The refinement data showed that all compounds formed in a tetragonal structure…
Role of Ca2+ doping on the enhancement of dielectric properties of Sr2–xCaxNiWO6 for energy storage device application
